Nanotechnology and Nanoelectronics: Materials, Devices, Measurement Techniques / под ред. W. R. Fahrner

Secondary Author: Fahrner, W. R., Wolfgang R.Language: английский.Country: США.Publication: New York : Springer, 2005Description: 269 p. : ил.ISBN: 3540224521.Bibliography: References: p. 239-260.; Index: p. 261-268..Subject: физика | техника | наноматериалы | нанотехнологии | наноэлектроника | английский язык
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Item type Current library Call number Status Barcode
Books НТБ ТПУ Читальный зал технической литературы (309 НТБ) 539.2 N21 Available 13821000292470
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References: p. 239-260.

Index: p. 261-268.

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