Nanotechnology and Nanoelectronics: Materials, Devices, Measurement Techniques / под ред. W. R. Fahrner
Language: английский.Country: США.Publication: New York : Springer, 2005Description: 269 p. : ил.ISBN: 3540224521.Bibliography: References: p. 239-260.; Index: p. 261-268..Subject: физика | техника | наноматериалы | нанотехнологии | наноэлектроника | английский язык| Cover image | Item type | Current library | Home library | Collection | Shelving location | Call number | Materials specified | Vol info | URL | Copy number | Status | Notes | Date due | Barcode | Item holds | Item hold queue priority | Course reserves | |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| Books | НТБ ТПУ Читальный зал технической литературы (309 НТБ) | 539.2 N21 | Available | 13821000292470 |
Total holds: 0
References: p. 239-260.
Index: p. 261-268.
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